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AT520SE交(jiao)流(liu)(liu)(liu)低電(dian)(dian)(dian)阻(zu)(zu)測(ce)試儀 是一種性價比較(jiao)高的(de)交(jiao)流(liu)(liu)(liu)電(dian)(dian)(dian)阻(zu)(zu)測(ce)試儀。測(ce)試接觸(chu)電(dian)(dian)(dian)阻(zu)(zu)、電(dian)(dian)(dian)池(chi)內部電(dian)(dian)(dian)阻(zu)(zu)和(he)電(dian)(dian)(dian)池(chi)電(dian)(dian)(dian)壓(ya)。本產(chan)品(pin)(pin)可同時測(ce)量(liang)電(dian)(dian)(dian)阻(zu)(zu)和(he)電(dian)(dian)(dian)壓(ya)并比較(jiao)電(dian)(dian)(dian)池(chi)內阻(zu)(zu)和(he)開路電(dian)(dian)(dian)壓(ya)，可*替代Hioki3550，Hioki3555，比較(jiao)適用于(yu)電(dian)(dian)(dian)池(chi)流(liu)(liu)(liu)水線上的(de)產(chan)品(pin)(pin)分選和(he)出廠檢(jian)驗。也可用于(yu)低電(dian)(dian)(dian)流(liu)(liu)(liu)測(ce)試條件下來表征機電(dian)(dian)(dian)元件的(de)低阻(zu)(zu)特性，符合GB5095/GJB1217測(ce)試要求(qiu)。同時還是一款經(jing)濟實用的(de)交(jiao)流(liu)(liu)(liu)毫歐表。

更新日期：2020-04-07

訪問量：754

￥3000

AT520交流(liu)低電(dian)(dian)(dian)(dian)阻(zu)測(ce)(ce)試儀(yi) 是一種(zhong)高精(jing)度、高穩定性的(de)交流(liu)電(dian)(dian)(dian)(dian)阻(zu)測(ce)(ce)試儀(yi)。主要用于測(ce)(ce)量(liang)接觸電(dian)(dian)(dian)(dian)阻(zu)、電(dian)(dian)(dian)(dian)池(chi)(chi)內部電(dian)(dian)(dian)(dian)阻(zu)和(he)電(dian)(dian)(dian)(dian)池(chi)(chi)電(dian)(dian)(dian)(dian)壓。本(ben)產(chan)品(pin)可(ke)同(tong)時測(ce)(ce)量(liang)電(dian)(dian)(dian)(dian)阻(zu)和(he)電(dian)(dian)(dian)(dian)壓并比較電(dian)(dian)(dian)(dian)池(chi)(chi)內阻(zu)和(he)開路(lu)電(dian)(dian)(dian)(dian)壓。AT520標配RS232C和(he)HANDLER接口(kou)，配合安柏(bo)儀(yi)器ATS520數(shu)據采集軟件(jian)，可(ke)實現自(zi)動化(hua)測(ce)(ce)量(liang)，準(zhun)確快速(su)的(de)判斷(duan)電(dian)(dian)(dian)(dian)池(chi)(chi)劣化(hua)情況，比較適用于電(dian)(dian)(dian)(dian)池(chi)(chi)流(liu)水線上(shang)的(de)產(chan)品(pin)分選和(he)出廠檢(jian)驗。也(ye)可(ke)用于低電(dian)(dian)(dian)(dian)流(liu)測(ce)(ce)試條件(jian)下來表征機電(dian)(dian)(dian)(dian)元件(jian)的(de)低阻(zu)特性。

更新日期：2020-04-07

訪問量：777

￥3000

AT520M高(gao)壓電(dian)(dian)池(chi)(chi)內阻(zu)(zu)測(ce)試(shi)儀  是全新設計的電(dian)(dian)池(chi)(chi)內阻(zu)(zu)測(ce)試(shi)儀，彌(mi)補了AT520只能測(ce)試(shi)60V電(dian)(dian)壓的空白，520M 針對高(gao)壓電(dian)(dian)池(chi)(chi)進行電(dian)(dian)壓和(he)內阻(zu)(zu)測(ce)試(shi)，內置(zhi)直流高(gao)電(dian)(dian)壓表。 AT520M 可(ke)以測(ce)試(shi)10μΩ~30Ω的電(dian)(dian)池(chi)(chi)內阻(zu)(zu)，并(bing)且同時(shi)可(ke)以測(ce)試(shi)高(gao)100V的電(dian)(dian)池(chi)(chi)電(dian)(dian)壓。 AT520M適(shi)用于100V以下電(dian)(dian)池(chi)(chi)的測(ce)試(shi)。相對優惠的價格定能滿(man)足您生產的需(xu)要。

更新日期：2020-04-07

訪問量：671

￥3000

AT528L手(shou)持(chi)電(dian)(dian)(dian)池測(ce)(ce)(ce)(ce)試(shi)儀(yi) 是采(cai)用高性能(neng)32位(wei)ARM微處理器控(kong)制的(de)微型手(shou)持(chi)式儀(yi)器，大(da)容量(liang)(liang)(liang)鋰電(dian)(dian)(dian)池實現超長待機3.5吋真彩(cai)液晶屏方便您讀取測(ce)(ce)(ce)(ce)量(liang)(liang)(liang)數(shu)據，AT528L通過測(ce)(ce)(ce)(ce)量(liang)(liang)(liang)電(dian)(dian)(dian)池的(de)電(dian)(dian)(dian)壓(ya)和內阻(zu)可快速的(de)判斷電(dian)(dian)(dian)池的(de)劣化情況，儀(yi)器可以測(ce)(ce)(ce)(ce)試(shi)0.1mΩ~200.0Ω的(de)電(dian)(dian)(dian)阻(zu)，0~50V直流電(dian)(dian)(dian)壓(ya)，電(dian)(dian)(dian)阻(zu)大(da)3200顯(xian)示位(wei)數(shu)，電(dian)(dian)(dian)壓(ya)大(da)3000顯(xian)示位(wei)數(shu)。儀(yi)器的(de)電(dian)(dian)(dian)阻(zu)測(ce)(ce)(ce)(ce)量(liang)(liang)(liang)采(cai)用矢量(liang)(liang)(liang)測(ce)(ce)(ce)(ce)試(shi)原(yuan)理，電(dian)(dian)(dian)壓(ya)測(ce)(ce)(ce)(ce)量(liang)(liang)(liang)采(cai)用差分測(ce)(ce)(ce)(ce)試(shi)原(yuan)理，能(neng)準確的(de)測(ce)(ce)(ce)(ce)出開路電(dian)(dian)(dian)壓(ya)。

更新日期：2020-04-07

訪問量：719

￥3000